serial block-face electron microscopy(English)

• electrons with 1–3 keV energies are incident on a specimen block, from which backscattered electron (BSE) images are collected with x, y resolution of 5–10 nm in the block-face plane, and successive layers are removed by an in situ ultramicrotome; aka SBF-SEM
• ATUM-SEM, SBF-SEM, BSE, SEM, ATUM, FIBSEM, SBF
• Microscopy, Nano-sciences
• https://doi.org…598-018-31231-w